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ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
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Graphical abstract
Current Issue
Volume 39 (5); September 2026
Latest Issue: Volume 39 No 5
Editor-in-Chief:
Chang Kyu Jeong
Print ISSN:
1226-7945
Online ISSN:
2288-3258
E-Submission
Recent Advances in True Random Number Generators Based on Emerging Material-Based Semiconductor Devices: Toward Wearable and Flexible Electronics
Yooyeon Jo, Daniel Juhyung Joe, Joon Young Kwak
J Electr Electron Mater 2026;39(5):443-461.
Two-Dimensional Van Der Waals Magnets: Materials Engineering Pathways
Junhyeon Jo
J Electr Electron Mater 2026;39(5):462-470.
Practical Guide to Analyzing Dynamics Using X-ray Photon Correlation Spectroscopy (XPCS)
Jeong-Woo Sun, Jong Eun Ryu, Wook Jo
J Electr Electron Mater 2026;39(5):471-477.
Effect of BaZrO
3
Addition on the Frequency and Temperature Dependent Dielectric Properties of BaTiO
3
-Based Ceramics
Won-Su Lee, Jong Kyu Lee, Moon-Taek Cho, et al.
J Electr Electron Mater 2026;39(5):478-486.
Phase Transition of Li
3
PO
4
Solid Electrolyte for Secondary Batteries in Vacuum: A Real-Time Synchrotron X-ray Scattering Study
Dong-Hyeon Shin, Seung-Han Lee, Tae-Sik Cho
J Electr Electron Mater 2026;39(5):487-492.
Analysis of Yield and Electrical Characteristics of Ag Electrode-Based Volatile Threshold Switching Memristors with Al
2
O
3
Dielectric Films Under Different ALD Process Conditions
Wan-Sik Woo, Seung-Jin Lee, Moon-Seok Kim, et al.
J Electr Electron Mater 2026;39(5):493-500.
Low-Temperature Sintering and Piezoelectric Properties of the PZN-PZT Ceramics with LiBiO
2
Nayoon Kwon, Yong Geun Choi, Young Jin Lee, et al.
J Electr Electron Mater 2026;39(5):501-509.
Transfer Process of Thermally Annealed Thin Films Using a Metal Sacrificial Layer and Etch Access Holes
Huijin Kim, Boseong Son, Daegang Kim, et al.
J Electr Electron Mater 2026;39(5):510-518.
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