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Volume 18(6); June 2005

Effect of Bias Voltage of Influenced on a Property of Electrical and Optical of ZnO:Al
J Electr Electron Mater 2005;18(6):493-498.   Published online June 1, 2005
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Effect of Aromatic Acid Amplifier, 2-hydroxy-2`-tosyloxy Biphenyl, on the kind of Resist Resins
J Electr Electron Mater 2005;18(6):499-505.   Published online June 1, 2005
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Wafer Burn-in Method for SRAM in Multi Chip Package
J Electr Electron Mater 2005;18(6):506-509.   Published online June 1, 2005
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Excitation Light Source Dependence of Photo-catalytic Efficiency for Benzene Removal
J Electr Electron Mater 2005;18(6):510-514.   Published online June 1, 2005
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A Study on the Within Wafer Non-uniformity of Oxide Film in CMP
J Electr Electron Mater 2005;18(6):521-526.   Published online June 1, 2005
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K-band Coplanar Stripline Resonator for Microwave Tunable Devices
J Electr Electron Mater 2005;18(6):532-537.   Published online June 1, 2005
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Microwave Dielectric Properties of the 0.7Mg4Ta2O9-0.3SrTiO3 Ceramics with Sintering Temperature
J Electr Electron Mater 2005;18(6):538-542.   Published online June 1, 2005
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Electrical and Dielectric Properties of ZnO-Pr6O11-based Varistors with sintering Time
J Electr Electron Mater 2005;18(6):543-549.   Published online June 1, 2005
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Structural and Dielectric Properties of Pb(Zr0.2Ti0.8)O3 Thick Films Fabricated using a Screen Printing Technologies
Sung Gap Lee, Young Jae Shim
J Electr Electron Mater 2005;18(6):550-553.   Published online June 1, 2005
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Genomic Detection using Electrochemical method
J Electr Electron Mater 2005;18(6):560-570.   Published online June 1, 2005
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Comparison of Electrical Properties and AFM Images of DSSCs with Various Sintering Temperature of TiO2 Electrodes
J Electr Electron Mater 2005;18(6):571-575.   Published online June 1, 2005
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A Study of Properties of GaN grown using In-situ SiN Mask by MOCVD
J Electr Electron Mater 2005;18(6):582-586.   Published online June 1, 2005
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