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Volume 15(4); April 2002

A Study of Boron Profiles by High Energy lon Implantation in Silicon: Won Chae Jung; J Korean Inst Electr Electron Mater Eng 2002;15(4):289-300. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.289

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Direct Bonding of Si∥SiO2/Si3N4∥Si Wafer Pairs with a Fast Linear Annealing: Sang Hyun Lee, Sang Don Yi, Oh Sung Song; J Korean Inst Electr Electron Mater Eng 2002;15(4):301-307. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.301

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Effect of Au Additive on The Bi Site in The Bi2-xAuxSr2CaCu2O8+δ ( x = 0 ~ 0.15 ) Superconductors: Min Soo Lee, Bong Soo Choi, Jeong Hwa Lee, Ki Young Song, Sung Hae Jung, Byung You Hong; J Korean Inst Electr Electron Mater Eng 2002;15(4):308-313. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.308

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Effect of CF4 Addition on Ferroelectric YMnO3 Thin Film Etching: Jae Hwa Park, Kyoung Tae Kim, Chang Il Kim, Eui Goo Chang, Cheol In Lee; J Korean Inst Electr Electron Mater Eng 2002;15(4):314-318. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.314

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Reduce of Etching Damage of PZT Thin Films with Addition of Ar and O2 in CI2/CF4 Plasma: Kyoung Tae Kim, Chang Il Kim, Myoung Gu Kang; J Korean Inst Electr Electron Mater Eng 2002;15(4):319-324. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.319

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Implementation of 70MHz IF Filter with Slanted Finger IDTs on 128°LiNbO3 Substrates: Taek Joo Lee, Duck Jin Chung; J Korean Inst Electr Electron Mater Eng 2002;15(4):325-331. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.325

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Analysis of Electroluminescent Device Using Fractal Theory: Jae Cheol Cho, Gye Choon Park, Kyung Jin Hong; J Korean Inst Electr Electron Mater Eng 2002;15(4):332-337. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.332

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Piezoelectric Characteristics and Temperature Stability of Resonant Frequency of PbTiO3 System Ceramics for High Frequency Resonator using 3rd Overtone Thickness Vibration Mode: Ju Hyun Yoo, Suk Kyu Min, Sang Mo Hwang, Chang Yub Park, Hyun Sang Yoon; J Korean Inst Electr Electron Mater Eng 2002;15(4):338-343. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.338

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Modeling of 3-D Embedded Inductors Fabricated in LTCC Process: Seo Goo Lee, Jong Seong Choi, Il Gu Yun; J Korean Inst Electr Electron Mater Eng 2002;15(4):344-348. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.344

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Ionic Conductivity of Solid Solution Ceramics in The System of Stabilized ZrO2 Prepared by Self - Propagating High - Temperature Synthesis: Korbova N ., Dea Wha Soh; J Korean Inst Electr Electron Mater Eng 2002;15(4):349-355. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.349

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Piezoelectric and Dielectric Characteristics of PAN-PZT Ceramics with BaCO3 Addition: Ta Ri Park, Dong Kyun Lee, Ji Won Choi, Chong yun Kang, Hyun Jai Kim, Seok Jin Yoon, Tae Kuk Ko; J Korean Inst Electr Electron Mater Eng 2002;15(4):356-360. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.356

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Organic Insulation Material : Crystal Structure and Electrochemical Properties of LiMn2-yMyO4 Cathode Material by Complex Substitution of Mg and Zn: In Seong Jeong, Hae Duk Chung, Hal Bon Gu; J Korean Inst Electr Electron Mater Eng 2002;15(4):361-366. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.361

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Display , Optical Devices : The vertical Growth of CNTs by DC Bias - Assisted PECVD and Their Field Emission Properties: Seong Hoe Jeong, Kwang Sik Kim, Gun Eik Jang, Ho Jin Ryu; J Korean Inst Electr Electron Mater Eng 2002;15(4):367-372. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.367

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Superconductor Magnetic Materials : Effect of Plasma Oxidation Time on TMR Devices of CoFe/AIO/CoFe/NiFe Structure: Oh Sung Song, Young Min Lee; J Korean Inst Electr Electron Mater Eng 2002;15(4):373-379. Published online April 1, 2002; DOI: https://doi.org/10.4313/JKEM.2002.15.4.373

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