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CI2/CF4 플라즈마에 Ar , O2 첨가에 따른 PZT 박막의 식각 손상 개선 효과

김경태, 김창일, 강명구

Reduce of Etching Damage of PZT Thin Films with Addition of Ar and O2 in CI2/CF4 Plasma

Kyoung Tae Kim, Chang Il Kim, Myoung Gu Kang
J Electr Electron Mater 2002;15(4):319-324.
Published online: April 1, 2002
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Reduce of Etching Damage of PZT Thin Films with Addition of Ar and O2 in CI2/CF4 Plasma
J Electr Electron Mater. 2002;15(4):319-324.   Published online April 1, 2002
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Reduce of Etching Damage of PZT Thin Films with Addition of Ar and O2 in CI2/CF4 Plasma
J Electr Electron Mater. 2002;15(4):319-324.   Published online April 1, 2002
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