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Keywords
Chemical mechanical polishing (2)
Friction force (2)
PDP (2)
(100) Orientation (1)
Abrasives concentration (1)
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Keywords
Chemical mechanical polishing (2)
Friction force (2)
PDP (2)
(100) Orientation (1)
Abrasives concentration (1)
Abrasives size (1)
Ac PDP (1)
Address period discharge (1)
Address time (1)
ADS (1)
AIN (1)
Arc discharge (1)
Bending test (1)
Binder (1)
Channel length (1)
Characterization of ferroelectric thin film (1)
Charge and discharge capacities (1)
Coefficient of friction (1)
Conductive adhesive (1)
Contamination degree evaluation (1)
Contrast ratio (1)
Corona discharge (1)
Counter electrode (1)
Degree of distortion (1)
Diamond-like carbon(a-C:H) (1)
Dimer (1)
Dry film (1)
Dye-sensitized solar cell (1)
EDLC (1)
Electro-optical (1)
Electrochemical reaction (1)
Electromechanical coupling factor(kp) (1)
EO (1)
EPDM polymer insulator (1)
Forward voltage-drop (1)
Fringe-field switching (1)
Green sheet (1)
Guard ring (1)
High temperature misfiring (1)
Hydrophobicity (1)
Impedance (1)
Impurity concentration (1)
Interdigital capacitance (1)
Ion beam alignment (1)
Laser induced CVD (1)
Laser photodepostion (1)
Laser repair (1)
Latch-up current (1)
LCD (1)
Leakage current (1)
Liquid crystal display (1)
LMW (1)
Lubrication (1)
Magnetotransistor (1)
Material removal (1)
MCT (1)
MnO2 (1)
Multiwalled carbon nanotubes (1)
MWCNT (1)
Pb-free ceramics (1)
Photodissociation (1)
PI (1)
Piezoelectric constant(d33) (1)
Plasma display panel (1)
Polyimide (1)
Polymer film (1)
Priming effect (1)
Ramp erase pulse (1)
Resistivity (1)
Response time (1)
RF magnetron sputtering (1)
Roughness (1)
Silicone rubber (1)
Specific capacitance (1)
SSIMT (1)
STN (1)
Super twisted nematic (1)
Tape casting (1)
TFT LCD (1)
Transparent dielectric (1)
Tuneable filter (1)
Uniformity (1)
V-T curve (1)
V-T hysteresis (1)
Wear (1)
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Previous issues
Volume 17(10); October 2004
A Study on the Orientation and the Roughness with the Deposition Condition of AIN Thin Films Prepared by RF Magnetron Sputtering Method
J Electr Electron Mater
2004;17(10):1023-1028.
Published online October 1, 2004
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Characteristics of the Suppressed Sidewall Injection Magnetotransistor using a CMOS Process
J Electr Electron Mater
2004;17(10):1029-1033.
Published online October 1, 2004
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6
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Characteristics of Anode Current due to the Impurity Concentration and the Channel Length of Lateral MOS-controlled Thyristor
J Electr Electron Mater
2004;17(10):1034-1040.
Published online October 1, 2004
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5
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Characteristics of Friction Affecting CMP Results
J Electr Electron Mater
2004;17(10):1041-1048.
Published online October 1, 2004
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4
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Effect of Abrasive Particles on Frictional Force and Abrasion in Chemical Mechanical Polishing(CMP)
J Electr Electron Mater
2004;17(10):1049-1055.
Published online October 1, 2004
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3
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Dielectric and Piezoelectric Properties of Pb-free Bi(Na,K)TiO3-SrTiO3 Ceramics with MnO2 Addition
J Electr Electron Mater
2004;17(10):1056-1060.
Published online October 1, 2004
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7
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0
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Characterization of Ferroelectric Thin Film in Microwave Region
J Electr Electron Mater
2004;17(10):1061-1068.
Published online October 1, 2004
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Investigation of Surface Degradation in Silicone Rubber Due to Corona Exposure
J Electr Electron Mater
2004;17(10):1068-1078.
Published online October 1, 2004
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5
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Electric and Mechanical Properties of CMC+PTFE Binary Binder Electrode for Electric Double Layer Capacitor
J Electr Electron Mater
2004;17(10):1079-1084.
Published online October 1, 2004
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6
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Charge-discharge Properties of Positive Active Material Li(Cr0.4Mn0.6)O2
J Electr Electron Mater
2004;17(10):1085-1089.
Published online October 1, 2004
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6
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Electrochemical Properties of Carbon Nano-tube as the Counter Electrode of Dye-sensitized solar cell
J Electr Electron Mater
2004;17(10):1090-1094.
Published online October 1, 2004
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9
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Electro-Optical Characteristics of Plastic STN Cell using Low Temperature Process
J Electr Electron Mater
2004;17(10):1095-1099.
Published online October 1, 2004
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8
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A Study on Electro-optical Characteristics of the Ion Beam Aligned FFS Cell on a Inorganic Thin Film
J Electr Electron Mater
2004;17(10):1100-1106.
Published online October 1, 2004
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6
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The Fabrication and Properties of Lead-free Transparent Dielectric Thick Films for PDP
J Electr Electron Mater
2004;17(10):1107-1113.
Published online October 1, 2004
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5
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Repairing of a Defective Metallic Line using Laser CVD Deposited Tungsten Film in TFT LCD
J Electr Electron Mater
2004;17(10):1114-1119.
Published online October 1, 2004
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5
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New Address Waveform for Improvement of the Priming Effect and the Contrast Ratio
J Electr Electron Mater
2004;17(10):1120-1124.
Published online October 1, 2004
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9
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A Study on the Improvement of the High Temperature Misfiring in AC PDP
J Electr Electron Mater
2004;17(10):1125-1131.
Published online October 1, 2004
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6
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High Voltage Engineering : Diagnosis Technique of Surface Contamination Degree for EPDM Insulator according to Variation of Environment Condition
J Electr Electron Mater
2004;17(10):1132-1141.
Published online October 1, 2004
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4
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