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로이 응용을 위한 비정질 In-Si-O 다층구조 특성 평가

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Regular Paper Characterization of Amorphous In-Si-O Multilayer for Low Emissivity Applications

Young Seong Lee, Sang Yeol Lee
J Electr Electron Mater 2014;27(8):483-485.
Published online: August 1, 2014
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Transparent amorphous In-Si-O (ISO)/Ag/In-Si-O (ISO) has been reported for low emissivity(low-e) applications. Effective Si doping into the In2O3 matrix led to a completely amorphous ISO film aswell as a low resistivity and a high optical transmittance. The optical and electrical performances wereexamined by measuring transmittance with a UV-VIS spectrophotometer and resistivity with a Hall effectmeasurement. Consequently, low-e glass with ISO/Ag/ISO showed a high transparency in the visibleregion and low emissivity in the infrared region, indicating that ISO is a promising amorphoustransparent electrode for low-e glass.

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Regular Paper Characterization of Amorphous In-Si-O Multilayer for Low Emissivity Applications
J Electr Electron Mater. 2014;27(8):483-485.   Published online August 1, 2014
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Regular Paper Characterization of Amorphous In-Si-O Multilayer for Low Emissivity Applications
J Electr Electron Mater. 2014;27(8):483-485.   Published online August 1, 2014
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