Study on Contact Resistance on the Performance of Oxide Thin Film Transistors

Jae Sang Lee; Sang Mo Koo; Sang Yeol Lee

Articles

Page Path

산화물 박막 트랜지스터 동작에 대한 접촉 저항의 영향

이재상, 구상모, 이상렬

Study on Contact Resistance on the Performance of Oxide Thin Film Transistors

Jae Sang Lee, Sang Mo Koo, Sang Yeol Lee

J Electr Electron Mater 2009;22(9):747-750.
Published online: September 1, 2009

6 Views
0 Download
0 Crossref
0 Scopus

prev next

Full Article

Download PDF

Keywords: ZrO2, a-IGZO, Thin film transistor

Cite

CITE

export

Copy Download

Format

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

RIS — For EndNote, ProCite, RefWorks, and most other reference management software
BibTeX — For JabRef, BibDesk, and other BibTeX-specific software

Include:

Citation for the content below
Citation and abstract for the content below

Study on Contact Resistance on the Performance of Oxide Thin Film Transistors

J Electr Electron Mater. 2009;22(9):747-750. Published online September 1, 2009

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

RIS — For EndNote, ProCite, RefWorks, and most other reference management software
bib — For JabRef, BibDesk, and other BibTeX-specific software

Include:

Citation for the content below
Citation and abstract for the content below

Study on Contact Resistance on the Performance of Oxide Thin Film Transistors

J Electr Electron Mater. 2009;22(9):747-750. Published online September 1, 2009

Articles

Page Path

산화물 박막 트랜지스터 동작에 대한 접촉 저항의 영향

Study on Contact Resistance on the Performance of Oxide Thin Film Transistors

Full Article

CITE

Download Citation

Format:

Include:

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS