Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

Nano-scale PMOSFET에서 Plasma Nitrided Oixde에 대한 소자 특성의 의존성

한인식, 지희환, 구태규, 유욱상, 최원호, 박성형, 이희승, 강영석, 김대병, 이희덕

Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET

, , , , , , , , ,
J Electr Electron Mater 2007;20(7):569-574.
Published online: July 1, 2007
  • 7 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET
J Electr Electron Mater. 2007;20(7):569-574.   Published online July 1, 2007
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET
J Electr Electron Mater. 2007;20(7):569-574.   Published online July 1, 2007
Close

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.