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"X-ray photoelectron spectroscopy"

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"X-ray photoelectron spectroscopy"

Practical Guide to X-ray Spectroscopic Data Analysis
Jae-hyeon Cho, Wook Jo
J Korean Inst Electr Electron Mater Eng 2022;35(3):223-231.   Published online May 1, 2022
DOI: https://doi.org/10.4313/JKEM.2022.35.3.3
Spectroscopies are the most widely used for understanding the crystallographic, chemical, and physical aspects of materials; therefore, numerous commercial and non-commercial software have been introduced to help researchers better handling their spectroscopic data. However, not many researchers, especially early-stage ones, have a proper background knowledge on the choice of fitting functions and a technique for actual fitting, although the essence of such data analysis is peak fitting. In this regard, we present a practical guide for peak fitting for data analysis. We start with a basic-level theoretical background why and how a certain protocol for peak fitting works, followed by a step-by-step visualized demonstration how an actual fitting is performed. We expect that this contribution is sure to help many active researchers in the discipline of materials science better handle their spectroscopic data.
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Fabrication of the Solution-Derived BiAlO Thin Film by Using Brush Coating Process for Liquid Crystal Device
Ju Hwan Lee, Dai-hyun Kim
J Korean Inst Electr Electron Mater Eng 2021;34(5):321-326.   Published online September 1, 2021
DOI: https://doi.org/10.4313/JKEM.2021.34.5.321
We fabricated BiAlO thin film by a solution process with a brush coating to be used as liquid crystal (LC) alignment layer. Solution-processed BiAlO was coated on the glass substrate by brush process. Prepared thin films were annealed at different temperatures of 80℃, 180℃, and 280℃. To verify whether the BiAlO film was formed properly, X-ray photoelectron spectroscopy analysis was performed on Bi and Al. Using a crystal rotation method by polarized optical microscopy, LC alignment state was evaluated. At the annealing temperature of 280℃, the uniform homogenous LC alignment was achieved. To reveal the mechanism of LC alignment by brush coating, field emission scanning electron microscope was used. Through this analysis, spin-coated and brush coated film surface were compared. It was revealed that physical anisotropy was induced by brush coating at a high annealing temperature. Particles were aligned in one direction along which brush coating was made, resulting in a physical anisotropy that affects a uniform LC alignment. Therefore, it was confirmed that brush coating combined with BiAlO thin film annealed at high temperature has a significant potential for LC alignment.
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Effects of Citric Acid as a Complexing Agent on Material Removal in Cu CMP
J Korean Inst Electr Electron Mater Eng 2006;19(10):889-893.   Published online October 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.10.889
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Gradational Double Annealing Process for Improvement of Thermal Characteristics of NiCr Thin Films
J Korean Inst Electr Electron Mater Eng 2005;18(8):714-719.   Published online August 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.8.714
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