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"Neural Network"

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In this study, we systematically investigated the effects of thermal atomic layer deposition (ALD) conditions on the electrical characteristics of conductive-filament-based volatile threshold switching memristors with a Pt/Al₂O₃/Ag structure. Although volatile threshold switching memristors have attracted significant attention for neuromorphic computing applications such as spiking neural networks, the impact of dielectric deposition conditions on their switching behavior remains relatively unexplored. The number of ALD cycles was varied from 40 to 200, and the deposition temperature was varied from 50 to 250°C to evaluate their effects on threshold voltage (Vth), off-state resistance (Roff), and device yield. Devices fabricated using 75–150 ALD cycles showed clear volatile threshold switching behavior with relatively high device yield, whereas excessively low or high cycle numbers resulted in short-type and open-type failures, respectively. In addition, Vth and Roff tended to increase at higher deposition temperatures, while the device yield significantly degraded above 150°C. These results indicate that the number of ALD cycles and the deposition temperature define a critical process window for achieving volatile threshold switching while suppressing both short-type and open-type failures. This study provides practical guidelines for optimizing dielectric ALD conditions in conductive-filament-based volatile threshold switching memristors for future neuromorphic hardware applications.
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A Review on Evaluation of Elastic Modulus Using Nanoindentation
Seo Hyeon Jang, Oh Min Kwon, Si Hyun Park, Hyun Wook Cho, Jong-hyoung Kim
J Korean Inst Electr Electron Mater Eng 2025;38(3):247-253.   Published online May 1, 2025
DOI: https://doi.org/10.4313/JKEM.2025.38.3.2
This review examines the principles, limitations, and recent advancements in elastic modulus measurement using nanoindentation. The importance of accurate contact area prediction is discussed, along with the Oliver-Pharr method and its limitations. The Continuous Stiffness Measurement (CSM) technique is presented as a significant improvement, allowing continuous measurement of mechanical properties throughout the indentation process. For ultra-thin films, the Li and Vlassak method, which incorporates Yu's solution and the concept of effective thickness, is highlighted as a means to correct for substrate effects. Recent developments in artificial neural network-based models for elastic modulus prediction are also explored. These advancements have greatly expanded the applicability of nanoindentation in semiconductor and MEMS device reliability assessment.

Citations

Citations to this article as recorded by  
  • Material characterization and local mechanical study with nanoindentation on the stainless steel 316L part with embedded optical fiber sensor fabricated with electrical field-assisted sintering technique for severe environment application
    Wei Li, Minoo Tayefeh Kazemi, Afreeda Hossain, Hongbing Lu
    Materials Characterization.2026; 240: 116959.     CrossRef
  • Microstructure-controlled nanoscale deformation and scratch-induced damage evolution in a spark plasma sintered TiVAlNbHfCr high-entropy alloy: Experimental characterization and physics-guided analysis
    Sheetal Kumar Dewangan, You Jin Lee, Byungmin Ahn
    Journal of Materials Research and Technology.2026; 45: 7027.     CrossRef
  • 351 View
  • 4 Download
  • 2 Crossref
AI Algorithm for Stabilizing Output of Multi-Environment Double-Sided Solar Panels
Jongman Kim, Byonghak Moon, Changyong Jung, Sungjin Park
J Korean Inst Electr Electron Mater Eng 2025;38(2):213-218.   Published online March 1, 2025
DOI: https://doi.org/10.4313/JKEM.2025.38.2.13
We propose a real-time information propagation arithmetic neural network (PANN) that minimizes the loss of power generation output of the system in the event of sudden changes in the module due to strong external typhoons or earthquakes at the solar power generation facility site. In addition, we propose a new double-sided module reflector that can reduce the local loss of power generation efficiency of the single-sided module reflector that is currently widely distributed, as well as the environmental pollution and inconvenience of maintenance work of the existing double-sided module. We present a computational network that can detect the faulty solar panel in real-time by checking the fault status of the installed solar panel and using a real-time computation method through a node-to-node diffusion method. In particular, this method recognizes the power loss part due to sudden changes in the module in real time and can take emergency measures for various nonlinear field facilities through a neural structure that finds the optimal distance up, down, left, and right. To confirm the characteristics of the loss reduction control of the field facility, we confirmed that the system was configured as a 7-degree-of-freedom control model using the PANN neural network learning structure method and improved the power generation output. PANN (Propagation Arithmetic Neural Networks) and various module systems are proposed for the real-time recovery of faulty solar panels and improving module system efficiency.
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Prediction of Material’s Formation Energy Using Crystal Graph Convolutional Neural Network
Hyun-gi Lee, Dong-hwa Seo
J Korean Inst Electr Electron Mater Eng 2022;35(2):134-142.   Published online March 1, 2022
DOI: https://doi.org/10.4313/JKEM.2022.35.2.4
As industry and technology go through advancement, it is hard to search new materials which satisfy various standards through conventional trial-and-error based research methods. Crystal Graph Convolutional Neural Network(CGCNN) is a neural network which uses material’s features as train data, and predicts the material properties(formation energy, bandgap, etc.) much faster than first-principles calculation. This report introduces how to train the CGCNN model which predicts the formation energy using open database. It is anticipated that with a simple programming skill, readers could construct a model using their data and purpose. Developing machine learning model for materials science is going to help researchers who should explore large chemical and structural space to discover materials efficiently.
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Image Analysis by CNN Technique for Maintenance of Porcelain Insulator
In-hyuk Choi, Koo-yong Shin, Ja-bin Koo, Ju-am Son, Dae-yeon Lim, Tae-keun Oh, Young-geun Yoon
J Korean Inst Electr Electron Mater Eng 2020;33(3):239-244.   Published online May 1, 2020
DOI: https://doi.org/10.4313/JKEM.2021.33.3.14
This study examines the feasibility of the image deep learning method using convolution neural networks (CNNs) to maintain a porcelain insulator. Data augmentation is performed to prevent over-fitting, and the classification performance is evaluated by training the age, material, region, and pollution level of the insulator using image data in which the background and labelling are removed. Based on the results, it was difficult to predict the age, but it was possible to classify 76% of the materials, 60% of the pollution level, and more than 90% of the regions. From the results of this study, we identified the potential and limitations of the CNN classification for the four groups currently classified. However, it was possible to detect discoloration of the porcelain insulator resulting from physical, chemical, and climatic factors. Based on this, it will be possible to estimate the corrosion of the cap and discoloration of the porcelain caused by environmental deterioration, abnormal voltage, and lightning.
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Modeling of PECVD Oxide Film Properties Using Neural Networks
Eun Jin Lee, Tae Seon Kim
J Korean Inst Electr Electron Mater Eng 2010;23(11):831-836.   Published online November 1, 2010
DOI: https://doi.org/10.4313/JKEM.2010.23.11.831
  • 140 View
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Modeling of Indium Tin Oxide(ITO) Film Deposition Process using Neural Network
Chul Hong Min, Sung Jin Park, Neung Goo Yoon, Tae Seon Kim
J Korean Inst Electr Electron Mater Eng 2009;22(9):741-746.   Published online September 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.9.741
  • 136 View
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  • 144 View
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Modeling of RE Sputtering Process for ZnO Thin Film Deposition using Neural Network
J Korean Inst Electr Electron Mater Eng 2006;19(7):624-630.   Published online July 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.7.624
  • 132 View
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Classification Technique of Kaolin Contaminants Degree for Polymer Insulator using Electromagnetic Wave
J Korean Inst Electr Electron Mater Eng 2006;19(2):162-168.   Published online February 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.2.162

Citations

Citations to this article as recorded by  
  • Harmonics Analysis of Leakage Current due to Artificial Contamination of Distribution Arresters
    Jae-Jun Park
    The Transactions of The Korean Institute of Electrical Engineers.2012; 61(9): 1306.     CrossRef
  • Analysis of Leakage Current Waveforms for Transmission Line Porcelain Insulators due to ESDD Contamination
    Jae-Jun Park
    The Transactions of The Korean Institute of Electrical Engineers.2012; 61(10): 1461.     CrossRef
  • 183 View
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  • 2 Crossref
Feature Extraction of Simulated Fault Signals in Stator Windings of a High Voltage Motor and Classification of Faulty Signals
Jae Jun Park, In Bum Jang
J Korean Inst Electr Electron Mater Eng 2005;18(10):965-975.   Published online October 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.10.965
  • 141 View
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High Voltage Engineering : PD Classification by Neural Networks in Specimen of XLPE Power Cable
J Korean Inst Electr Electron Mater Eng 2004;17(8):898-903.   Published online August 1, 2004
DOI: https://doi.org/10.4313/JKEM.2004.17.8.898
  • 133 View
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High Voltage Engineering : The Analysis of PD Signal using Neural Network
Jong Seo Kim, Yong Pil Park, Min U Cheon
J Korean Inst Electr Electron Mater Eng 2004;17(5):567-571.   Published online May 1, 2004
DOI: https://doi.org/10.4313/JKEM.2004.17.5.567
  • 131 View
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High Voltage Engineering : Patten Analysis of Trouble Signal on DS for GIS using Neural Network
Jong Seo Kim, Eun Seog Lee, Jong Cheol Cheon
J Korean Inst Electr Electron Mater Eng 2003;16(12s):1310-1315.
DOI: https://doi.org/10.4313/JKEM.2003.16.12s.1310

Citations

Citations to this article as recorded by  
  • Performance Improvement for Automatic Classification of Partial Charge Types using ConvLSTM2D Technique
    Su-Il Lee, Seok-Il Song, Dae-Sik Ko
    The Journal of Korean Institute of Information Technology.2021; 19(4): 19.     CrossRef
  • 200 View
  • 1 Download
  • 1 Crossref