Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
Negative bias temperature instability
WHERE t1.sid in(parameter_dbtbl_keyword '%Negative bias temperature instability%') and t1.xml_status <> 99
2
results for
"Negative bias temperature instability"
Filter
Keywords
NBTI (2)
Negative bias temperature instability (2)
0.13um (1)
300mm (1)
Boron penetration (1)
More +
Publication year
2007 (1)
2005 (1)
Keywords
NBTI (2)
Negative bias temperature instability (2)
0.13um (1)
300mm (1)
Boron penetration (1)
DPN (1)
Fixed oxide charge (Qf) (1)
Interface trap charge (Qit) (1)
Nano CMOSFET (1)
Nitrogen (1)
Plasma nitrided oxide (1)
Cancel
Close
authors
Cancel
Close
Publication Year
2007 (1)
2005 (1)
Cancel
Close
Funded articles
Cancel
Close
"Negative bias temperature instability"
Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET
J Electr Electron Mater
2007;20(7):569-574.
Published online July 1, 2007
PDF
9
View
0
Download
Improvement of Negative Bias Temperature Instability by Decoupled Plasma Nitridation Process
J Electr Electron Mater
2005;18(10):883-890.
Published online October 1, 2005
PDF
5
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
