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"Micropipe density"

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"Micropipe density"

Characterization of Non-polar 6H-SiC Substrates for Optoelectronic Device Applications
Im Gyu Yeo, Tae Woo Lee, Jung Woo Choi, Jung Doo Seo, Kap Ryeol Ku, Won Jae Lee, Byung Chul Shin, Young Hee Kim
J Korean Inst Electr Electron Mater Eng 2009;22(5):390-396.   Published online May 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.5.390
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Diameter Expansion of 6H-SiC Single Crystals by the Modification of Crucible Structure Design
J Korean Inst Electr Electron Mater Eng 2006;19(7):673-679.   Published online July 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.7.673
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4H-SiC (0001）Epilayer Growth and Electrical Property of Schottky Diode
Shigehiro Nishino
J Korean Inst Electr Electron Mater Eng 2006;19(4):344-349.   Published online April 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.4.344

Citations

Citations to this article as recorded by  
  • Electrical characteristics of polycrystalline 3C-SiC thin film diodes
    Gwiy-Sang Chung, Jeong-Hak Ahn
    Journal of Sensor Science and Technology.2007; 16(4): 259.     CrossRef
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  • 1 Crossref
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