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"Epi-layer"

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"Epi-layer"

Regular Paper : Semiconductor ; Developing of Super Junction MOSFET A ccordjing to Charge Imbalance Effect
Ey Goo Kang
J Electr Electron Mater 2014;27(10):613-617.   Published online October 1, 2014
This paper was analyzed electrical characteristics of super junction power MOSFETconsidering to charge imbalance. We extracted optimal design and process parameter at -15% of chargeimbalance. Considering extracted design and process parameters, we fabricated super junction MOSFETand analyzed electrical characteristics. We obtained 600∼650 V breakdown voltage, 224∼240 mΩ onresistance. This paper was showed superior on resistance of super junction MOSFET. We can use forautomobile industry.
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Study on Latch Up Characteristics of Super Junction MOSFET According to Trench Etch Angle
Hun Suk Chung, Ey Goo Kang
J Electr Electron Mater 2014;27(9):551-554.   Published online September 1, 2014
This paper was showed latch up characteristics of super junction power MOSFET by parasiticthyristor according to trench etch angle. As a result of research, if trench etch angle of super junction MOSFET is larger, we obtained large latch up voltage. When trench etch angle was 90°, latch up voltage was more 50 V. and we got 700 V breakdown voltage. But we analyzed on resistance. if trench etch angle of super junction MOSFET is larger, we obtained high on resistance. Therefore, we need optimal point by simulation and experiment for solution of trade off.
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Regular Paper Electrical Characteristics of Super Junction MOSFET According to Trench Etch Angle of P-pillar
Ey Goo Kang
J Electr Electron Mater 2014;27(8):497-500.   Published online August 1, 2014
In this paper, we analyze electrical characteristics of n/p-pillar layer according to trench anglewhich is the most important characteristics of SJ MOSFET and core process. Because research target is600 V class SJ MOSFET, so conclusively trench angle deduced 89.5 degree to implement the breakdownvoltage 750 V with 30% margin rate. we found that on resistance is 22 mohm·cm2 and threshold voltageis 3.5 V. Moreover, depletion layer of electric field distribution also uniformly distributes.
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Regular Paper Optimal Process Design of Super Junction MOSFET
Ey Goo Kang
J Electr Electron Mater 2014;27(8):501-504.   Published online August 1, 2014
This paper was developed and described core-process to implement low on resistance whichwas the most important characteristics of SJ (super junction) MOSFET. Firstly, using process-simulation,SJ MOSFET optimal structure was set and developed its process flow chart by repeated simulation. Following process flow, gate level process was performed. And source and drain level process wassimilar to genral planar MOSFET, so the process was the same as the general planar MOSFET. Andthen to develop deep trench process which was main process of the whole process, after finishing photomask process, we developed deep trench process. We expected that developed process was necessary todevelop SJ MOSFET for automobile semiconductor.
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