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Abrasive
WHERE t1.sid in(parameter_dbtbl_keyword '%Abrasive%') and t1.xml_status <> 99
7
results for
"Abrasive"
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Keywords
chemical mechanical polishing (5)
Abrasive (4)
CMP (3)
Removal rate (2)
Slurry (2)
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Publication year
2005 (1)
2004 (2)
2003 (4)
Authors
Sang Yong Kim (4)
Yong Jin Seo (4)
U Seon Lee (2)
Chang Jun Park (2)
Gi Lyang Byeon (1)
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Keywords
chemical mechanical polishing (5)
Abrasive (4)
CMP (3)
Removal rate (2)
Slurry (2)
Abrasives concentration (1)
Abrasives size (1)
Acid Colloidal Silica (1)
Atomistic Modeling (1)
Chemical Mechanical Planarization (1)
COC (1)
Consumables (1)
COO (1)
Copper (1)
cost of consumables (1)
cost of Ownership (1)
Dishing (1)
Eros on (1)
Fixed abrasive pad (1)
Friction force (1)
Mechanical Polishing (1)
Molecular Dynamics (1)
Non-uniformity (1)
NU (1)
Overpolishing (1)
Oxidizer (1)
Pattern selectivity (1)
Reused slurry (1)
RR (1)
Semi Abrasive Free Slurry (1)
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Sang Yong Kim (4)
Yong Jin Seo (4)
U Seon Lee (2)
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Gi Lyang Byeon (1)
Un Sig Choe (1)
Won Yeong Choe (1)
Woon Shik Choi (1)
Ho Jeong Hwang (1)
Ui Gu Jang (1)
Jeong Won Kang (1)
Nam Hun Kim (1)
Tae Hyeong Kim (1)
Woo Sun Lee (1)
Gyeong Jin Lee (1)
Jae Gyeong Lee (1)
Jin Sung Park (1)
Jin Seong Park (1)
Gi O Song (1)
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"Abrasive"
Fixed Abrasive Pad with Self-conditioning in CMP Process
J Korean Inst Electr Electron Mater Eng
2005;18(4):321-326.
Published online April 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.4.321
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Effect of Abrasive Particles on Frictional Force and Abrasion in Chemical Mechanical Polishing(CMP)
J Korean Inst Electr Electron Mater Eng
2004;17(10):1049-1055.
Published online October 1, 2004
DOI:
https://doi.org/10.4313/JKEM.2004.17.10.1049
PDF
Citations
Citations to this article as recorded by
Two-Step Chemical Mechanical Polishing of 4H-SiC (0001) Wafer
Weilei Wang, Weili Liu, Zhitang Song
ECS Journal of Solid State Science and Technology.2021; 10(7): 074004.
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A Study on Semi Abrasive Free Slurry including Acid Colloidal Silica for Copper Chemical Mechanical Planarization
Nam Hun Kim, Sang Yong Kim, Yong Jin Seo, Tae Hyeong Kim, Ui Gu Jang
J Korean Inst Electr Electron Mater Eng
2004;17(3):272-277.
Published online March 1, 2004
DOI:
https://doi.org/10.4313/JKEM.2004.17.3.272
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55
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Characteristics of 2-Step CMP (Chemical Mechanical Polishing) Process using Reused Slurry by Adding of Silica Abrasives
Yong Jin Seo, Gyeong Jin Lee, Un Sig Choe, Sang Yong Kim, Jin Seong Park, U Seon Lee
J Korean Inst Electr Electron Mater Eng
2003;16(9):759-764.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.759
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56
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Chemical Mechanical Polishing Characteristics of Mixed Abrasive Slurry by Adding Of Alumina Abrasive in Diluted Silica Slurry
Yong Jin Seo, Chang Jun Park, Woon Shik Choi, Sang Yong Kim, Jin Sung Park, Woo Sun Lee
J Korean Inst Electr Electron Mater Eng
2003;16(6):465-470.
Published online June 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.6.465
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68
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Effects of Mixed Oxidizer on the W-CMP Characteristics
Chang Jun Park, Yong Jin Seo, Sang Yong Kim, U Seon Lee
J Korean Inst Electr Electron Mater Eng
2003;16(12s):1181-1186.
DOI:
https://doi.org/10.4313/JKEM.2003.16.12s.1181
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60
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Atomistic Modeling of Spherical Nano Abrasive-Substrate Interaction
Jeong Won Kang, Gi O Song, Won Yeong Choe, Gi Lyang Byeon, Jae Gyeong Lee, Ho Jeong Hwang
J Korean Inst Electr Electron Mater Eng
2003;16(12s):1157-1164.
DOI:
https://doi.org/10.4313/JKEM.2003.16.12s.1157
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58
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