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Volume 21(8); August 2008

Reliability Analysis for Deuterium Incorporated Gate Oxide Film through Negative-bias Temperature Instability and Hot-carrier Injection: Jae Sung Lee; J Korean Inst Electr Electron Mater Eng 2008;21(8):687-694. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.687

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High Mobility Characteristics of Strained-Si-on-insulator (sSOI) Metal-oxide-semiconductors Field-effect-transistors (MOSFETs): Kwan Su Kim, Won Ju Cho; J Korean Inst Electr Electron Mater Eng 2008;21(8):695-698. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.695

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Capacitance-voltage Characteristics of MOS Capacitors with Ge Nanocrystals Embedded in HfO2 Gate Material: Byoung Jun Park, Hye Ryeong Lee, Kyoung Ah Cho, Sang Sig Kim; J Korean Inst Electr Electron Mater Eng 2008;21(8):699-705. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.699

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A Study on High Temperature Operation of SOI-MOSFET: Chang Yong Choi, Kyung Sook Moon, Sang Mo Koo; J Korean Inst Electr Electron Mater Eng 2008;21(8):706-710. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.706

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C-V Characterization of Plasma Etch-damage Effect on (100) SOI: Yeong Deuk Jo, Ji Hong Kim, Dae Hyung Cho, Byung Moo Moon, Won Ju Cho, Hong Bay Chung, Sang Mo Koo; J Korean Inst Electr Electron Mater Eng 2008;21(8):711-714. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.711

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ITO Wet Etch Properties in an In-Line Wet Etch,Cleaning System by using an Alternating Movement of Substrate: Sung Jae Hong, Sang Jik Kwon, Eou Sik Cho; J Korean Inst Electr Electron Mater Eng 2008;21(8):715-718. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.715

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Design of the Driver IC for 500 V Half-bridge Converter using Single Ended Level Shifter with Large Noise Immunity: Hyun Il Park, Ki Nam Song, Yong An Lee, Hyoung Woo Kim, Ki Hyun Kim, Kil Soo Seo, Seok Bung Han; J Korean Inst Electr Electron Mater Eng 2008;21(8):719-726. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.719

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Etching Characteristics of VO2 Films in Inductively coupled CI2,Ar Plasma: Hee Sung Jung, Sung Ihl Kim, Kwang Ho Kwon; J Korean Inst Electr Electron Mater Eng 2008;21(8):727-732. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.727

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Thermal Stability Improvement of Ni-germanide using Ni-Co alloy for Ge-MOSFETs Technology: Kee Young Park, Soon Yen Jung, Ying Ying Zhang, In Shik Han, Shi Guang Li, Zhun Zhong, Hong Sik Shin, Yeong Cheol Kim, Jae Jun Kim, Ga Won Lee, Jin Suk Wang; J Korean Inst Electr Electron Mater Eng 2008;21(8):733-737. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.733

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Electrical Properties of ZnO-Bi2O3-Sb2O3 Ceramics: Youn Woo Hong, Hyo Soon Shin, Dong Hun Yeo, Jong Hee Kim, Jin Ho Kim; J Korean Inst Electr Electron Mater Eng 2008;21(8):738-748. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.738

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Thermal Characteristics of Epoxy-Nanocomposites filled Several Types Nano Layered Silicate Particles: Jun Jae Park; J Korean Inst Electr Electron Mater Eng 2008;21(8):749-754. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.749

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Citations

Citations to this article as recorded by

Preparation and Characterization of Electrically and Thermally Conductive Polymeric Nanocomposites
Mousam Choudhury, Smita Mohanty, Sanjay K Nayak, Rakesh Aphale
Journal of Minerals and Materials Characterization and Engineering.2012; 11(07): 744. CrossRef

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Dielectric Characteristics on Filler Content and Sintering Temperature in Pb-Free White Dielectric Layer: Yong Tae An, Byung Hyun Choi, Mi Jung Ji, Jung Min Lee, Hyun Sun Kim, Kyung Won Jung; J Korean Inst Electr Electron Mater Eng 2008;21(8):755-759. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.755

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Effect of LEDs Light of 633 nm Wavelength in Skin of Organism: Min Woo Cheon; J Korean Inst Electr Electron Mater Eng 2008;21(8):760-765. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.760

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Characteristics of ZnO Nanowire Fabricated by Thermal Evaporation Method Depending on Different Temperatures and Oxygen Pressure: Won Seok Oh, Gun Eik Jang; J Korean Inst Electr Electron Mater Eng 2008;21(8):766-769. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.766

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Comparison of Heart Rate Variability with Pulse Transit Time during General Anesthesia: Seong Wan Baik, Tae Kyun Kim, Jae Hyung Kim, Gye Rok Jeon, Soo Young Ye; J Korean Inst Electr Electron Mater Eng 2008;21(8):770-775. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.770

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Implementation of Wireless ECG Measurement System Attaching in Chair for Ubiquitous Health Care Environment: Soo Young Ye, Seong Wan Baik, Jee Chul Kim, Gye Rok Jeon; J Korean Inst Electr Electron Mater Eng 2008;21(8):776-781. Published online August 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.8.776

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