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Volume 9(5); June 1996

The Effect of Nd2O3 Addition on the Microwave Dielectric Properties of the BSST Ceramics: In Gil Park, Ki Won Ryu, Seon Gi Bae, Young Hie Lee; J Electr Electron Mater 1996;9(5):439-444.

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Optical Characteristics of Se Thin Film Fabricated by EBE Method: Hae Duck Chung, Ki Sik Lee; J Electr Electron Mater 1996;9(5):445-449.

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A Study on the Electrical Properties of Lipid Monolayers by Displacement Current Method: Kyung Sup Lee, Young Soo Kwon; J Electr Electron Mater 1996;9(5):450-454.

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Characteristics of Mn - Ni - Co System for Automobile Fuel Shortage Detecting Sensor with Bi2O3 Addition: Jun Rag Yoon, Heon Yong Lee, Doo Young Kim, Chang Sub Oh; J Electr Electron Mater 1996;9(5):455-461.

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A Study on the Characteristics of Double Insulating Layer for HgCdTe MIS: Jin Won Jung; J Electr Electron Mater 1996;9(5):463-469.

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Synthesis of Fiber - Textured Diamond Films by MWPECVD: Jae Chul Park, Byong Sang Kim; J Electr Electron Mater 1996;9(5):470-475.

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A Study on the Botton Oxide Scaling for Dielectric in Stacked Capacitor Using L/L Vacuum System: Yang Hee Joung, Myoung Kyu Kim; J Electr Electron Mater 1996;9(5):476-482.

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Electrical Characteristics of PET Film for Wire Insulation of Transformer in Fluorrcarbon: Chang Su Huh, Jae Bok Lee; J Electr Electron Mater 1996;9(5):483-489.

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Preparation of Damage - less SnO2 Thin Films by RF Magnertron Sputtering with Oxide Target: Sung Ho Shin, Hyun Hoo Kim; J Electr Electron Mater 1996;9(5):490-497.

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A Study on AR , HR Coating Simulation for the High Power Laser Diode: Jeong Seon Ryoo, Yung Sup Yoon; J Electr Electron Mater 1996;9(5):498-505.

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A Study on Fast Langmuir Probe Driving Circuit for Measurement of Plasma Parameter and Its Application: Jung Hong Shin, Tai Eun Ko, Doo Hwan Kim, Chung Hoo Park; J Electr Electron Mater 1996;9(5):506-511.

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Semiconductor Magnetic Field Sensors: Jun Ho Cha, Nam Young Kim; J Electr Electron Mater 1996;9(5):512-517.

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Integrated - Optic Sensors in Glass: Chang Hee Hyoung, Jong Heon Kim; J Electr Electron Mater 1996;9(5):518-524.

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