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Keywords
Dielectric properties (2)
Partial discharge (2)
Ag-Sn-In (1)
AIN (1)
Al2O3 (1)
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Authors
Arsen Babajayan (1)
Keywords
Dielectric properties (2)
Partial discharge (2)
Ag-Sn-In (1)
AIN (1)
Al2O3 (1)
Ammonium sulfide solution (1)
Animal cell (1)
Benzotriazole (1)
Borosilicate (1)
BTA (1)
C-V (1)
Capacitance-voltage (1)
Ceramic/glass (1)
Citric acid (1)
Classification (1)
Colloidal silica (1)
Contact material (1)
Copper CMP (1)
CS sol (1)
Diagnosis (1)
Dielectric constant (1)
Electrical tree (1)
Electromechanical coupling factor (1)
Finite difference method (1)
Flicker noise (1/f noise) (1)
Hybrid film (1)
Hydrogen peroxide (1)
Initial-oxidation (1)
Internal oxidation (1)
Kelvin-probe method (1)
Lead-free ceramics (1)
Low-frequency noise (1)
Low-Level Light source (1)
LTCC (1)
Mechanical quality factor (1)
Mobility (1)
MSD (1)
MTT assay (1)
Multilayer ultrasonic nozzle (1)
Nano CMOSFET (1)
Nano silica (1)
Natronomonas pharaonis (1)
Near-field microwave microscope (1)
Near-field scanning microwave microscope (1)
NpSR 2 (1)
NSMM (1)
OLED (1)
Optical power (1)
Organic field-effect transistor (OFET) CuPc (1)
Organic pentacene (1)
PEI (1)
Piezoelectric constant (1)
Piezoelectric planer coupling factor (1)
poly(epoxy-imide) (1)
Power cable (1)
Probability density (1)
Rapid solidification process (1)
Reactive sputtering method (1)
Reflection coefficient (1)
Reflection coefficient S(11) (1)
Remote plasma nitride oxide (1)
Rubrene (1)
S(11) (1)
Sensory rhodopsin 2 (1)
Sintering aids (1)
Stator winding (1)
Sub-threshold swing (1)
Surface potential (1)
Te (1)
Two colors (1)
Uniformity (1)
Very thin emission Layer (1)
Wavelet transform (1)
Wavelet-neural network (1)
White Light emission (1)
δ-doping (1)
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Previous issues
Volume 20(1); January 2007
Dependence of Low-frequency Noise and Device Characteristics on Initial Oxidation Method of Plasma-nitride Oxide for Nano-scale CMOSFET
J Electr Electron Mater
2007;20(1):1-7.
Published online January 1, 2007
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Electrical Characteristic of Al/AIN/GaAs MIS Capacitor Fabricated by Reactive Sputtering Method for the (NH4)2S Treatment
J Electr Electron Mater
2007;20(1):8-13.
Published online January 1, 2007
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5
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0
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Electron Distribution in the GaAs - Al(x)Ga(1-x)As Quantum Well with the Si δ-doped Layer in a Non-central Position under the External Electric Field
J Electr Electron Mater
2007;20(1):14-18.
Published online January 1, 2007
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5
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0
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The Properties on Ceramic/glass Composites of SiO2-B2O3-R(R=CaO, BaO, ZnO, Bi2O3) Borosilicate Glass System for Low Temperature Ceramics
J Electr Electron Mater
2007;20(1):19-24.
Published online January 1, 2007
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7
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0
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Piezoelectric and Dielectric Characteristics of Lead Free [Li(0.04)(Na(y)K(1-y)(0.96)](Nb(0.86)Ta(0.1)Sb(0.04))O3 Ceramics with the Variations of Na/K Ratio
J Electr Electron Mater
2007;20(1):25-30.
Published online January 1, 2007
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5
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0
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Piezoelectric and Dielectric Characteristics of Low Temperature Sintering PMN-PNN-PZT Ceramics According to the amount of PbO
J Electr Electron Mater
2007;20(1):31-34.
Published online January 1, 2007
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5
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0
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Synthesis of Poly(epoxy-imide)-Nano Silica Hybrid Film via CS Sol-gel Process and Their Dielectric Properties
J Electr Electron Mater
2007;20(1):35-40.
Published online January 1, 2007
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6
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0
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A Study on Space Charge of Organic Pentacene/metal Interface
Arsen Babajayan
J Electr Electron Mater
2007;20(1):41-46.
Published online January 1, 2007
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6
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1
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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor
J Electr Electron Mater
2007;20(1):47-52.
Published online January 1, 2007
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7
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0
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Electrical and Optical Characteristics of White OLEDs with a Rubrene doped Layer
J Electr Electron Mater
2007;20(1):53-56.
Published online January 1, 2007
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6
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0
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Analysis of PD Distribution Characteristics and Comparison of Classification Methods according to Electrical Tree Source in Power Cable
J Electr Electron Mater
2007;20(1):57-64.
Published online January 1, 2007
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7
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0
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Classification of Insulation Fault Signals for High Voltage Motors Stator Winding using Image Signal Process Technique
J Electr Electron Mater
2007;20(1):65-73.
Published online January 1, 2007
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5
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0
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Mechanical Analysis on Uniformity in Copper Chemical Mechanical Planarization
J Electr Electron Mater
2007;20(1):74-79.
Published online January 1, 2007
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5
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0
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Optical Characterization of Sensory Rhodopsin 2 Thin Films using a Near-filed Scanning Microwave Microscope
J Electr Electron Mater
2007;20(1):80-85.
Published online January 1, 2007
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5
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The Effect of the Te on the Microstructure of Rapidly Solidification Ag-Sn-In Contact Material
J Electr Electron Mater
2007;20(1):86-91.
Published online January 1, 2007
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6
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Characteristics of Low-Level Light Source for Animal Cell Proliferation
J Electr Electron Mater
2007;20(1):92-97.
Published online January 1, 2007
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5
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