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CuPc 두께 변화 및 채널 길이 변화에 따른 전계 효과 트랜지스터의 전기적 특성 연구

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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor

J Electr Electron Mater 2007;20(1):47-52.
Published online: January 1, 2007
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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor
J Electr Electron Mater. 2007;20(1):47-52.   Published online January 1, 2007
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor
J Electr Electron Mater. 2007;20(1):47-52.   Published online January 1, 2007
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