Study on Interfaces Properties of Glass / Sillicon by Firing Profiles

Chang Su Huh; Wan Tae Kim; Se Wook Yoon

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반도체 / 소성공정에 의한 Glass / Silicon 계면특성변화에 관한 연구

허창수, 김완태, 윤세욱

Study on Interfaces Properties of Glass / Sillicon by Firing Profiles

Chang Su Huh, Wan Tae Kim, Se Wook Yoon

J Electr Electron Mater 1999;12(8):679-688.
Published online: August 1, 1999

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Study on Interfaces Properties of Glass / Sillicon by Firing Profiles

J Electr Electron Mater. 1999;12(8):679-688. Published online August 1, 1999

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Study on Interfaces Properties of Glass / Sillicon by Firing Profiles

J Electr Electron Mater. 1999;12(8):679-688. Published online August 1, 1999

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반도체 / 소성공정에 의한 Glass / Silicon 계면특성변화에 관한 연구

Study on Interfaces Properties of Glass / Sillicon by Firing Profiles

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