A Study on the Life Time Prediction for the oxide of MOS Capacitor

Dong Hee Rhie; Bok Gil Choi; Man Young Sung; Byung Moo Moon; Yung Kwon Sung

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MOS 커패시터 절연막의 수명예측법에 관한 연구

이동희, 최복길, 성만영, 문병무, 성영권

A Study on the Life Time Prediction for the oxide of MOS Capacitor

Dong Hee Rhie, Bok Gil Choi, Man Young Sung, Byung Moo Moon, Yung Kwon Sung

J Electr Electron Mater 1999;12(7):611-617.
Published online: July 1, 1999

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A Study on the Life Time Prediction for the oxide of MOS Capacitor

J Electr Electron Mater. 1999;12(7):611-617. Published online July 1, 1999

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Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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bib — For JabRef, BibDesk, and other BibTeX-specific software

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Citation for the content below
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A Study on the Life Time Prediction for the oxide of MOS Capacitor

J Electr Electron Mater. 1999;12(7):611-617. Published online July 1, 1999

Articles

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MOS 커패시터 절연막의 수명예측법에 관한 연구

A Study on the Life Time Prediction for the oxide of MOS Capacitor

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