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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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실리콘에 MeV 로 이온주입된 인의 결함분포와 profile 에 관한 연구

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A Study of defect distribution and profiles of MeV implanted phosphorus in silicon

Won Chae Jung
J Electr Electron Mater 1997;10(9):881-888.
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A Study of defect distribution and profiles of MeV implanted phosphorus in silicon
J Electr Electron Mater. 1997;10(9):881-888.
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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A Study of defect distribution and profiles of MeV implanted phosphorus in silicon
J Electr Electron Mater. 1997;10(9):881-888.
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