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DTC 방법을 사용한 nMOSFET 의 공정파라메터 추출및 소자특성에 관한 연구

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A Study on Process Parameter Extraction and Device Characteristics of nMOSFET using DTC Method

Cheol In Lee, Eui Goo Chang
J Electr Electron Mater 1996;9(8):799-805.
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A Study on Process Parameter Extraction and Device Characteristics of nMOSFET using DTC Method
J Electr Electron Mater. 1996;9(8):799-805.
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A Study on Process Parameter Extraction and Device Characteristics of nMOSFET using DTC Method
J Electr Electron Mater. 1996;9(8):799-805.
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