Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

주파수응답함수(FRF)를 이용한 자기 애자의 손상평가

최인혁, 손주암, 오태근, 윤영근

Damage Evaluation of Porcelain Insulators Using the Frequency Response Function

In-hyuk Choi, Ju-am Son, Tae-keun Oh, Young-geun Yoon
J Electr Electron Mater 2019;32(2):122-128.
Published online: March 1, 2019
  • 5 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Porcelain insulators have been used mainly for power line fixing and electrical insulation in transmission towers. Porcelain insulators have generally a 30 years desired life, but over 50% exceed their life expectancy. Since the damage to porcelain insulators is usually accompanied by enormous loss of human resource material, their efficient maintenance has emerged as an important issue. In this regard, this study applied a frequency response function (FRF) for integrity assessment of the insulator. The characteristics of the FRF according to damage types were identified and analyzed by the change in natural frequencies, curve shape, attenuation, and Nyquist diagram stability. The results showed significant differences in the FRF according to damage types, which can be used as basic data for the effective integrity assessment of porcelain insulators.

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Damage Evaluation of Porcelain Insulators Using the Frequency Response Function
J Electr Electron Mater. 2019;32(2):122-128.   Published online March 1, 2019
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Damage Evaluation of Porcelain Insulators Using the Frequency Response Function
J Electr Electron Mater. 2019;32(2):122-128.   Published online March 1, 2019
Close