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EBSD를 이용한 1, 2차 용융흔 결정립의 방위 비교 분석

박광묵, 방선배, 양성채

The Orientation Comparison of the Primary and Secondary Beads Grain by EBSD

Kwang-muk Park, Sun-bae Bang, Sung-chae Yang
J Electr Electron Mater 2017;30(11):728-733.
Published online: November 1, 2017
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Herein, for the quantitative analysis of the arc beads related to electric fire, we used electron backscatter diffraction (EBSD), a measuring device for grain orientation of materials, we compared and analyzed the surface texture of primary and secondary beads according to the difference in cooling rate at ambient temperature. This analysis revealed that the primary beads showed similar distribution at both low and high angles, while the secondary beads showed a higher distribution at low angles than at high angles. Thus, EBSD can be used for quantitative analysis of the beads and can be applied to identify beads in the future.

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The Orientation Comparison of the Primary and Secondary Beads Grain by EBSD
J Electr Electron Mater. 2017;30(11):728-733.   Published online November 1, 2017
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Orientation Comparison of the Primary and Secondary Beads Grain by EBSD
J Electr Electron Mater. 2017;30(11):728-733.   Published online November 1, 2017
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