Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

기술 교육 : NDT 기법을 이용한 가공배전선로 내부 열화 진단장치 개발

현득창

Technology Education : Development of Diagnostic Device for Internal Degradation in Distribution Line Using NDT Mathod

Deuk Chang Hyun
J Electr Electron Mater 2015;28(8):539-543.
Published online: August 1, 2015
  • 7 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

At present, the development of a detection device in order to prevent accidents due to wire deterioration in the distribution lines is required. Distribution line is not possible to check the internal state in a normal way because it is covered with the coating. Accordingly, various eddy current techniques that is the non-destructive test (NDT) techniques have been applied to solve this problem. In this paper, we have seen examining the characteristic change of the eddy current sensor according to the simplified shape of the sensor in order to solve the problems for the simplified shape that is generated when the simulation for the shape of the eddy current sensor.

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Technology Education : Development of Diagnostic Device for Internal Degradation in Distribution Line Using NDT Mathod
J Electr Electron Mater. 2015;28(8):539-543.   Published online August 1, 2015
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Technology Education : Development of Diagnostic Device for Internal Degradation in Distribution Line Using NDT Mathod
J Electr Electron Mater. 2015;28(8):539-543.   Published online August 1, 2015
Close