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Low-Frequency Noise 측정을 통한 Bottom-Gated ZnO TFT의 문턱전압 불안정성 연구

정광석, 김영수, 박정규, 양승동, 김유미, 윤호진, 한인식, 이희덕, 이가원

Analysis of the Threshold Voltage Instability of Bottom-Gated ZnO TFTs with Low-Frequency Noise Measurements

Kwang Seok Jeong, Young Su Kim, Jeong Gyu Park, Seung Dong Yang, Yu Mi Kim, Ho Jin Yun, In Shik Han, Hi Deok Lee, Ga Won Lee
J Electr Electron Mater 2010;23(7):545-549.
Published online: July 1, 2010
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Analysis of the Threshold Voltage Instability of Bottom-Gated ZnO TFTs with Low-Frequency Noise Measurements
J Electr Electron Mater. 2010;23(7):545-549.   Published online July 1, 2010
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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Analysis of the Threshold Voltage Instability of Bottom-Gated ZnO TFTs with Low-Frequency Noise Measurements
J Electr Electron Mater. 2010;23(7):545-549.   Published online July 1, 2010
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