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PRAM을 위한 Si-doped Ge2Sb2Te5 박막의 상변화 특성 연구

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A Study on the Phase Change Characteristics of Si-doped Ge2Sb2Te5 Thin Films for PRAM

Seung Cheol Baek, Ki Ho Song, Hyun Yong Lee
J Electr Electron Mater 2010;23(4):261-266.
Published online: April 1, 2010
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A Study on the Phase Change Characteristics of Si-doped Ge2Sb2Te5 Thin Films for PRAM
J Electr Electron Mater. 2010;23(4):261-266.   Published online April 1, 2010
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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A Study on the Phase Change Characteristics of Si-doped Ge2Sb2Te5 Thin Films for PRAM
J Electr Electron Mater. 2010;23(4):261-266.   Published online April 1, 2010
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