Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

LPCVD로 성장된 다결정 3C-SiC 박막의 물리적 특성

정귀상, 김강산

Physical Characteristics of Polycrystalline 3C-SiC Thin Films Grown by LPCVD

,
J Electr Electron Mater 2006;19(8):732-736.
Published online: August 1, 2006
  • 6 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Physical Characteristics of Polycrystalline 3C-SiC Thin Films Grown by LPCVD
J Electr Electron Mater. 2006;19(8):732-736.   Published online August 1, 2006
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Physical Characteristics of Polycrystalline 3C-SiC Thin Films Grown by LPCVD
J Electr Electron Mater. 2006;19(8):732-736.   Published online August 1, 2006
Close