Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Degradation of Ultra-thin SiO2 Film Incorporated with Hydrogen or Deuterium Bonds during Electrical Stress
J Electr Electron Mater. 2005;18(11):996-1000. Published online November 1, 2005
