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반도체 STI - CMP 공정 적용을 위한 연마 정지점 고찰

김상용, 서용진

Semiconductor A Study of End Point Detection Measurement for STI - CMP Applications

Sang Yong Kim, Yong Jin Seo
J Electr Electron Mater 2001;14(3):175-184.
Published online: March 1, 2001
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Semiconductor A Study of End Point Detection Measurement for STI - CMP Applications
J Electr Electron Mater. 2001;14(3):175-184.   Published online March 1, 2001
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
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Semiconductor A Study of End Point Detection Measurement for STI - CMP Applications
J Electr Electron Mater. 2001;14(3):175-184.   Published online March 1, 2001
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