Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

Evaluation of Sticking Coefficient in BSCCO Thin Film Fabricated by Co-sputtering

Hee Kab Lee, Yong Pil Park, Kwon Hyun Lee, Joon Ung Lee
J Electr Electron Mater 2000;13(1):80-84.
Published online: January 1, 2000
  • 3 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Evaluation of Sticking Coefficient in BSCCO Thin Film Fabricated by Co-sputtering
J Electr Electron Mater. 2000;13(1):80-84.   Published online January 1, 2000
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Evaluation of Sticking Coefficient in BSCCO Thin Film Fabricated by Co-sputtering
J Electr Electron Mater. 2000;13(1):80-84.   Published online January 1, 2000
Close

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.