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"Vertical type probe card"

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"Vertical type probe card"

Development and Characterization of Vertical Type Probe Card for High Density Probing Test
J Korean Inst Electr Electron Mater Eng 2006;19(9):825-831.   Published online September 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.9.825

Citations

Citations to this article as recorded by  
  • Probe card-Type multizone electrostatic chuck inspection system
    Yoon Sung Koo, Jae Hwan Kim, Chan Su Han, Sang Jeen Hong
    Automatika.2023; 64(2): 389.     CrossRef
  • Optimization of Thermal Deformation in Probe Card
    Yong-Hoon Chang, Jeong-Je Yin, Yong-S. Suh
    Journal of the Korea Academia-Industrial cooperation Society.2010; 11(11): 4121.     CrossRef
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