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고밀도 프로빙 테스트를 위한 수직형 프로브카드의 제작 및 특성분석

민철홍, 김태선

Development and Characterization of Vertical Type Probe Card for High Density Probing Test

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J Electr Electron Mater 2006;19(9):825-831.
Published online: September 1, 2006
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Development and Characterization of Vertical Type Probe Card for High Density Probing Test
J Electr Electron Mater. 2006;19(9):825-831.   Published online September 1, 2006
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Development and Characterization of Vertical Type Probe Card for High Density Probing Test
J Electr Electron Mater. 2006;19(9):825-831.   Published online September 1, 2006
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