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"TCP-CVD"

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TCP-CVD (2)
Leakage current (1)
MOCON (1)
N2 plasma treatment (1)
OLED (1)

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2010 (1)
2003 (1)

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Jae Gyeong Go (1)
Do Yeong Kim (1)
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Chang Jo Kim (1)
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TCP-CVD (2)
Leakage current (1)
MOCON (1)
N2 plasma treatment (1)
OLED (1)
Polycrystalline thin film tranistor (1)
Si3N4 (1)
SiNx (1)
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Jae Gyeong Go (1)
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"TCP-CVD"

Thin Films and Sensors : Application of Si3N4 Thin Film as a Humidity Protection Layer for Organic Light Emitting Diode: Chang Jo Kim, Paik Kyun Shin; J Korean Inst Electr Electron Mater Eng 2010;23(5):397-402. Published online May 1, 2010; DOI: https://doi.org/10.4313/JKEM.2010.23.5.397

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Optimization of a SiOx/SiNxOyCz multilayer structure for a reliable gas diffusion barrier via low-temperature plasma-enhanced atomic layer deposition
Ju-Hwan Han, Su Ho Lim, Jin-Myung Choi, Seong-Hyeon Lee, Woojin Jeon, Jin-Seong Park
Ceramics International.2019; 45(6): 7407. CrossRef

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A Study on the Silicon Nitride for the poly-Si Thin Film Transistor: Do Yeong Kim, Chi Hyeong Kim, Jae Gyeong Go, Jun Sin Lee; J Korean Inst Electr Electron Mater Eng 2003;16(12s):1175-1180.; DOI: https://doi.org/10.4313/JKEM.2003.16.12s.1175

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