Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

1
results for

"Surface damage"

Keywords

Publication year

Authors

"Surface damage"

The Dependency of Surface Damage to NiSi for CMOS Technology
Hee Hwan Ji, Soon Eui Ahn, Mi Suk Bae, Hun Jin Lee, Soon Young Oh, Hi Deok Lee, Jin Suk Wang
J Korean Inst Electr Electron Mater Eng 2003;16(4):280-285.   Published online April 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.4.280
  • 53 View
  • 0 Download