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SRAM
WHERE t1.sid in(parameter_dbtbl_keyword '%SRAM%') and t1.xml_status <> 99
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SRAM (2)
Burn-in (1)
FIT (1)
Multi chip package (1)
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2005 (1)
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SRAM (2)
Burn-in (1)
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Reliability (1)
Soft error rate (1)
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Thin film transistor (1)
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"SRAM"
Reliability on Accelerated Soft Error Rate in Static RAM of Thin Film Transistor Type
J Electr Electron Mater
2006;19(6):507-511.
Published online June 1, 2006
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Wafer Burn-in Method for SRAM in Multi Chip Package
J Electr Electron Mater
2005;18(6):506-509.
Published online June 1, 2005
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