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Rougness
WHERE t1.sid in(parameter_dbtbl_keyword '%Rougness%') and t1.xml_status <> 99
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Crystailinity (1)
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Rougness (1)
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2009 (1)
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Jin Sa Kim (1)
Chung Hyeok Kim (1)
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"Rougness"
Surface Morphology and Dielectric Properties of SBN Thin Film by RF Sputtering Method
Jin Sa Kim, Chung Hyeok Kim
J Korean Inst Electr Electron Mater Eng
2009;22(8):671-676.
Published online August 1, 2009
DOI:
https://doi.org/10.4313/JKEM.2009.22.8.671
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