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"Resistive memory"

Regular Paper : Semiconductor ; Current Versus Voltage Characteristics of a Si Based 1-Diode Type Resistive Memory with Cr-SrTiO3 Films
Min Yeong Song, Yu Jeong Seo, Yeon Soo Kim, Hee Dong Kim, Ho Myoung An, Tae Geun Kim
J Electr Electron Mater 2011;24(11):855-858.   Published online November 1, 2011
In this paper, in order to suppress unwanted current paths originating from adjacent cells in a passive crossbar array based on resistive random access memory (RRAM) without extrinsic switching devices, 1-diode type RRAM which consists of a 0.2% chromium-doped strontium titanate (Cr-SrTiO3) film deposited on a silicon substrate, was proposed for high packing density, and intrinsic rectifying characteristics from the current versus voltage characteristics were successfully demonstrated.
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