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Probe card
WHERE t1.sid in(parameter_dbtbl_keyword '%Probe card%') and t1.xml_status <> 99
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"Probe card"
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Chip test (1)
Electro plating (1)
Electrolytic polishing (1)
Epoxy (1)
MEMS probe card (1)
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2007 (1)
2006 (1)
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Chip test (1)
Electro plating (1)
Electrolytic polishing (1)
Epoxy (1)
MEMS probe card (1)
Micro spring (1)
Micro-drilling (1)
Probe card (1)
Vertical type probe card (1)
Wafer Level test (1)
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"Probe card"
Development of 121 pins/mm2 High Density Probe Card using Micro-spring Architecture
J Electr Electron Mater
2007;20(9):749-755.
Published online September 1, 2007
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Development and Characterization of Vertical Type Probe Card for High Density Probing Test
J Electr Electron Mater
2006;19(9):825-831.
Published online September 1, 2006
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