Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
Article Template
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
PMOSFET
WHERE t1.sid in(parameter_dbtbl_keyword '%PMOSFET%') and t1.xml_status <> 99
2
results for
"PMOSFET"
Filter
Keywords
Barrier height (1)
Gate oxidation anneal (1)
High performance PMOSFET (1)
NBTI (1)
Ni-silicide (1)
More +
Publication year
2009 (1)
2003 (1)
Authors
Soon Yen Jung (1)
Young Min Kim (1)
Sun Kyu Kong (1)
Ga Won Lee (1)
Hi Deok Lee (1)
More +
Keywords
Barrier height (1)
Gate oxidation anneal (1)
High performance PMOSFET (1)
NBTI (1)
Ni-silicide (1)
Pd stacked structure (1)
PMOSFET (1)
Cancel
Close
authors
Soon Yen Jung (1)
Young Min Kim (1)
Sun Kyu Kong (1)
Ga Won Lee (1)
Hi Deok Lee (1)
Shi Guang Li (1)
Kee Young Park (1)
Hong Sik Shin (1)
Jin Suk Wang (1)
Ying Ying Zhang (1)
Cancel
Close
Publication Year
2009 (1)
2003 (1)
Cancel
Close
Funded articles
Cancel
Close
"PMOSFET"
Reduction of Barrier Height between Ni-silicide and P+ Source/drain for High Performance PMOSFET
Sun Kyu Kong, Ying Ying Zhang, Kee Young Park, Shi Guang Li, Soon Yen Jung, Hong Sik Shin, Ga Won Lee, Jin Suk Wang, Hi Deok Lee
J Korean Inst Electr Electron Mater Eng
2009;22(6):457-461.
Published online June 1, 2009
DOI:
https://doi.org/10.4313/JKEM.2009.22.6.457
PDF
55
View
0
Download
Impact of Post Gate Oxidation Anneal on Negatlve Bias Temperature Instability of Deep Submicron PMOSFETs
Young Min Kim
J Korean Inst Electr Electron Mater Eng
2003;16(3):181-185.
Published online March 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.3.181
PDF
52
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
