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Oxidizer
WHERE t1.sid in(parameter_dbtbl_keyword '%Oxidizer%') and t1.xml_status <> 99
5
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"Oxidizer"
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Keywords
Chemical Mechanical Polishing (4)
Oxidizer (4)
CMP (3)
Removal rate (3)
Potentiodynamic polarization (2)
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2005 (3)
2004 (1)
2003 (1)
Authors
Sang Yong Kim (2)
U Seon Lee (2)
Yong Jin Seo (2)
Chang Jun Park (1)
Keywords
Chemical Mechanical Polishing (4)
Oxidizer (4)
CMP (3)
Removal rate (3)
Potentiodynamic polarization (2)
Slurry (2)
Abrasive (1)
Catalyst (1)
CMP (chemical mechanical polishing) (1)
Electrochemical corrosion (1)
Mixed oxidizer (1)
Nickel (1)
Non-uniformity (1)
NU (1)
RR (1)
Selectivity (1)
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authors
Sang Yong Kim (2)
U Seon Lee (2)
Yong Jin Seo (2)
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2004 (1)
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"Oxidizer"
A Study on Oxidizer Effects in Tungsten CMP
J Korean Inst Electr Electron Mater Eng
2005;18(9):787-792.
Published online September 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.9.787
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Citations
Citations to this article as recorded by
Effect of Oxidizer on the Polishing in Cadmium Telluride CMP
Byeong Cheol Shin, Chang Suk Lee, Hae Do Jeong
Journal of the Korean Society for Precision Engineering.2015; 32(1): 69.
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Improvement of Chemical Mechanical Polishing (CMP) Performance of Nickel by Additions of Abrasive and Various Oxidizers
J Korean Inst Electr Electron Mater Eng
2005;18(7):605-609.
Published online July 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.7.605
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140
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Electrochemical Corrosion and Chemical Mechanical Polishing(CMP) Characteristics of Tungsten Film using Mixed Oxidizer
J Korean Inst Electr Electron Mater Eng
2005;18(4):303-308.
Published online April 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.4.303
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156
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Role of Oxidants for Metal CMP Applications
Yong Jin Seo, Sang Yong Kim, U Seon Lee
J Korean Inst Electr Electron Mater Eng
2004;17(4):378-383.
Published online April 1, 2004
DOI:
https://doi.org/10.4313/JKEM.2004.17.4.378
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130
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Effects of Mixed Oxidizer on the W-CMP Characteristics
Chang Jun Park, Yong Jin Seo, Sang Yong Kim, U Seon Lee
J Korean Inst Electr Electron Mater Eng
2003;16(12s):1181-1186.
DOI:
https://doi.org/10.4313/JKEM.2003.16.12s.1181
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