Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
Article Template
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
Index of refraction
WHERE t1.sid in(parameter_dbtbl_keyword '%Index of refraction%') and t1.xml_status <> 99
1
results for
"Index of refraction"
Filter
Keywords
Dielectric constant (1)
Ellipsometry (1)
Index of refraction (1)
Low-k (1)
Publication year
2008 (1)
Authors
Chang Su Hwang (1)
Hong Bae Kim (1)
In Hwan Yi (1)
Keywords
Dielectric constant (1)
Ellipsometry (1)
Index of refraction (1)
Low-k (1)
Cancel
Close
authors
Chang Su Hwang (1)
Hong Bae Kim (1)
In Hwan Yi (1)
Cancel
Close
Publication Year
2008 (1)
Cancel
Close
Funded articles
Cancel
Close
"Index of refraction"
A Study of the Dielectric Characteristics of the Low-k SiOCH Thin Films by Ellipsometry
In Hwan Yi, Chang Su Hwang, Hong Bae Kim
J Korean Inst Electr Electron Mater Eng
2008;21(12):1083-1089.
Published online December 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.12.1083
PDF
61
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
