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"Flexible device"

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"Flexible device"

Structural Stability for Pt Line and Cross-Bar Sub-Micron Patterns
Tae Wan Park, Woon Ik Park
J Korean Inst Electr Electron Mater Eng 2018;31(7):510-514.   Published online November 1, 2018
DOI: https://doi.org/10.4313/JKEM.2018.31.7.510
This study discusses and demonstrates the structural stability of highly ordered Pt patterns formed on a transparent and flexible substrate through the process of nanotransfer printing (nTP). Bending tests comprising approximately 1,000 cycles were conducted for observing Pt line patterns with a width of 1 μm formed along the direction of the horizontal (x-axis) and vertical (y-axis) axes (15 mm × 15 mm); and adhesion tests were performed with an ultrasonicator for a period greater than ten minutes, to analyze the Pt crossbar patterns. The durability of both types of patterns was systematically analyzed by employing various microscopes. The results show that the Pt line and Pt crossbar patterns obtained through nTP are structurally stable and do not exhibit any cracks, breaks, or damages. These results corroborate that nTP is a promising nanotechnology that can be applied to flexible electronic devices. Furthermore, the multiple patterns obtained through nTP can improve the working performance of flexible devices by providing excellent structural stability.
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Regular Paper : The Structural and Optical Characteristics of Mg0.3Zn0.7O Thin Films Deposited on PES Substrate According to Oxygen Pressure
Hyun Min Lee, Sang Hyun Kim, Na Kwon Jang, Hong Seung Kim
J Korean Inst Electr Electron Mater Eng 2014;27(11):760-765.   Published online November 1, 2014
DOI: https://doi.org/10.4313/JKEM.2014.27.11.760
MgZnO has attracted a lot of attention for flexible device. In the flexible substrate, the crystalstructure of the thin films as well as the surface morphology is not good. Therefore, in this study, westudied on the effects of the oxygen pressure on the structure and crystallinity of Mg0.3Zn0.7O thin films deposited on PES substrate by using pulsed laser deposition. We used X-ray diffraction and atomic forcemicroscopy in order to observe the structural characteristics of Mg0.3Zn0.7O thin films. The crystallinity ofMg0.3Zn0.7O thin films with increasing temperature was improved, Grain size and RMS of the films wereincreased. UV-visible spectrophotometer was used to get the band gap energy and transmittance. Mg0.3Zn0.7O thin films showed high transmittance over 90% in the visible region. As increased workingpressure from 30 mTorr to 200 mTorr, the bandgap energy of Mg0.3Zn0.7O thin film were decreased from3.59 eV to 3.50 eV.
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