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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"Film thickness"

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"Film thickness"

Ion Gel Gate Dielectrics for Polymer Non-volatile Transistor Memories
Boeun Cho, Moon Sung Kang
J Electr Electron Mater 2016;29(12):759-763.   Published online December 1, 2016
We demonstrate the utilization of ion gel gate dielectrics for operating non-volatile transistor memory devices based on polymer semiconductor thin films. The gating process in typical electrolyte-gated polymer transistors occurs upon the penetration and escape of ionic components into the active channel layer, which dopes and dedopes the polymer film, respectively. Therefore, by controlling doping and dedoping processes, electrical current signals through the polymer film can be memorized and erased over a period of time, which constitutes the transistor-type memory devices. It was found that increasing the thickness of polymer films can enhance the memory performance of device including (i) the current signal ratio between its memorized state and erased state and (ii) the retention time of the signal.
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Characterization of AI-doped ZnO (AZO) Transparent Conductive Thin Films Grown by Atomic Layer Deposition
Hyun June Jung, Woong Chul Shin, Soon Gil Yoon
J Electr Electron Mater 2009;22(2):137-141.   Published online February 1, 2009
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