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이온젤 전해질 절연체 기반 고분자 비휘발성 메모리 트랜지스터

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Ion Gel Gate Dielectrics for Polymer Non-volatile Transistor Memories

Boeun Cho, Moon Sung Kang
J Electr Electron Mater 2016;29(12):759-763.
Published online: December 1, 2016
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We demonstrate the utilization of ion gel gate dielectrics for operating non-volatile transistor memory devices based on polymer semiconductor thin films. The gating process in typical electrolyte-gated polymer transistors occurs upon the penetration and escape of ionic components into the active channel layer, which dopes and dedopes the polymer film, respectively. Therefore, by controlling doping and dedoping processes, electrical current signals through the polymer film can be memorized and erased over a period of time, which constitutes the transistor-type memory devices. It was found that increasing the thickness of polymer films can enhance the memory performance of device including (i) the current signal ratio between its memorized state and erased state and (ii) the retention time of the signal.

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Ion Gel Gate Dielectrics for Polymer Non-volatile Transistor Memories
J Electr Electron Mater. 2016;29(12):759-763.   Published online December 1, 2016
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Ion Gel Gate Dielectrics for Polymer Non-volatile Transistor Memories
J Electr Electron Mater. 2016;29(12):759-763.   Published online December 1, 2016
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