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"Contamination"

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"Contamination"

PLC Optical Sensor for Contamination Monitoring on the Flow-Cell in the Water Quality Measurement System
Seung Heon Han, Tae Un Kim, Haeng Yun Jung, Hyun Chul Ki, Doo Gun Kim, Seon Hoon Kim
J Electr Electron Mater 2019;32(6):472-476.   Published online November 1, 2019
We have proposed a novel planar lightwave circuit (PLC) optical sensor to monitor the contamination in a flow-cell where water is continuously supplied through a water quality measurement system. We designed a PLC chip with a V-shape waveguide and the simulated its function as a sensor for monitoring contamination in a flow-cell using a numerical the FDTD (finite-difference time-domain) analysis. A novel cross type of waveguide was introduced to make the PLC chip of the V-shaped waveguide. The fabricated PLC was cut into the cross waveguide. A change in the optical propagation loss of the PLC sensor was observed after immersing the PLC sensor into city water. It was determined that the propagation loss of the PLC sensor was 3 dB at a wavelength of 1.55 μm in the city water for 15 days.
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Diagnostic tests were performed on two high voltage (HV) motor stator windings. These tests included the measurement of insulation resistance, polarization index, AC current, dissipation factor (tanδ) and partial discharge (PD) magnitude. Surface contamination of HV motor stator windings has an effect on the AC current and tanδ. When the stator windings were finished cleaning and insulation reinforcement, the increase rate of AC current (ΔI) and dissipation factor (Δtanδ) were very small compared to those before cleaning. However, the PD magnitude remained the same. These tests show that cleaning and insulation reinforcement of HV motor stator windings can reduce the insulation failure.
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High Voltage and Discharge Engineering : Regular Paper ; Discharge Characteristics and UV Images at Air on Bushing Model with Contaminations
Man Sik Pang, Jae Hyeong Choi, Woo Jin Kim, Young Seok Kim, Sang Hyun Kim
J Electr Electron Mater 2011;24(12):996-1001.   Published online December 1, 2011
A bushing is very important because it must supply the high voltage to the power equipment. Generally, the surface of bushing is contaminated with rain, dust, salt and others. A bushing with contaminations at air are serious problem in insulation. Therefore, it is important to understand the inspection and diagnoses of the safety. The ultra-violet rays(UV) camera has attracted interest from the view point of easy judgement. In this paper, we will report on the corona discharge characteristics on bushing model with contaminations. Also, UV images of discharge in air are analyzed using prototype UV camera of Korea. These results are studied at both AC and DC voltage under a non-uniform field.
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High Voltage and Discharge Engineering : Monitoring Technique and Device of Surface Contamination for Line-Post Insulator
Gyung Suk Kil, Dae Won Park, Kwang Seok Jung, Sun Jae Kim, Dong Hoan Seo
J Electr Electron Mater 2010;23(5):413-417.   Published online May 1, 2010
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Effect of PVA Brush Contamination on Post-CMP Cleaning Performance
Han Chul Cho, Min Jong Yuh, Suk Joo Kim, Hae Do Jeong
J Electr Electron Mater 2009;22(2):114-118.   Published online February 1, 2009
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The Characteristic Variation of Mask with Plasma Treatment
Jwa Yeon Kim, Sang Su Choi, Byung Sun Kang, Dong Soo Min, Young Jin An
J Electr Electron Mater 2008;21(2):111-117.   Published online February 1, 2008
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Analysis and Reduction of Impurity Contamination Induced by Plasma Etching on Si Surface
J Electr Electron Mater 2006;19(12):1078-1084.   Published online December 1, 2006
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Classification Technique of Kaolin Contaminants Degree for Polymer Insulator using Electromagnetic Wave
J Electr Electron Mater 2006;19(2):162-168.   Published online February 1, 2006
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Effects of Added Silicone Oils on the Surface Hydrophobicity of Silicone Rubber
J Electr Electron Mater 2006;19(1):46-51.   Published online January 1, 2006
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Investigation on DHF Application at Metal CMP Cleaning Process
Sang Yong Kim, Nam Hoon Kim, In Pyo Kim, Eui Goo Chang
J Electr Electron Mater 2003;16(7):569-572.   Published online July 1, 2003
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