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C-V characteristics
WHERE t1.sid in(parameter_dbtbl_keyword '%C-V characteristics%') and t1.xml_status <> 99
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C-V characteristics (2)
FTIR (2)
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2D-correlation analysis (1)
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2009 (1)
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Chang Su Hwang (2)
Jong Wook Kim (2)
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Yong Heon Park (1)
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C-V characteristics (2)
FTIR (2)
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"C-V characteristics"
Properties of Dielectric Constant and Bonding Mode of Annealed SiOCH Thin Film
Jong Wook Kim, Chang Su Hwang, Yong Heon Park, Hong Bae Kim
J Electr Electron Mater
2009;22(1):47-52.
Published online January 1, 2009
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Properties of SiOCH Thin Film Dielectric constant by BTMSM/O2 Flow Rates
Jong Wook Kim, Chang Su Hwang, Hong Bae Kim
J Electr Electron Mater
2008;21(4):362-367.
Published online April 1, 2008
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