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Tex(Sb85Ge15)100-x 상변화 광기록 박막의 결정화 특성

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Crystallization Properties of Tex(Sb85Ge15)100-x Thin Film as Phase Change Optical Recording Media

Hong Seok Kim, Hyun Yong Lee, Hong Bay Chung
J Electr Electron Mater 1998;11(4):314-320.
Published online: April 1, 1998
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Crystallization Properties of Tex(Sb85Ge15)100-x Thin Film as Phase Change Optical Recording Media
J Electr Electron Mater. 1998;11(4):314-320.   Published online April 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Crystallization Properties of Tex(Sb85Ge15)100-x Thin Film as Phase Change Optical Recording Media
J Electr Electron Mater. 1998;11(4):314-320.   Published online April 1, 1998
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