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분석 조건에 따른 p - MOSFET 의 게이트에 유기된 드레인 누설전류의 열화

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Degradation of Gate Induced Drain Leakage ( GIDL ) Current of p - MOSFET along to Analysis Condition

Ji Cheol Bae, Yong Jae Lee
J Electr Electron Mater 1997;10(1):26-31.
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Degradation of Gate Induced Drain Leakage ( GIDL ) Current of p - MOSFET along to Analysis Condition
J Electr Electron Mater. 1997;10(1):26-31.
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Degradation of Gate Induced Drain Leakage ( GIDL ) Current of p - MOSFET along to Analysis Condition
J Electr Electron Mater. 1997;10(1):26-31.
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