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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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자기애자의 자기부 균열 식별을 위한 이미지 처리기법 개발

최인혁, 신구용, 안호성, 구자빈, 손주암, 임대연, 오태근, 윤영근

Development of Image Process for Crack Identification on Porcelain Insulators

In-hyuk Choi, Koo-yong Shin, Ho-song An, Ja-bin Koo, Ju-am Son, Dae-yeon Lim, Tae-keun Oh, Young-geun Yoon
J Electr Electron Mater 2020;33(4):303-309.
Published online: July 1, 2020
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This study proposes a crack identification algorithm to analyze the surface condition of porcelain insulators and to efficiently visualize cracks. The proposed image processing algorithm for crack identification consists of two primary steps. In the first step, the brightness is eliminated by converting the image to the lab color space. Then, the background is removed by the K-means clustering method. After that, the optimum image treatment is applied using morphological image processing and median filtering to remove unnecessary noise, such as blobs. In the second step, the preprocessed image is converted to grayscale, and any cracks present in the image are identified. Next, the region properties, such as the number of pixels and the ratio of the major to the minor axis, are used to separate the cracks from the noise. Using this image processing algorithm, the precision of crack identification for all the sample images was approximately 80%, and the F1 score was approximately 70. Thus, this method can be helpful for efficient crack monitoring.

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Development of Image Process for Crack Identification on Porcelain Insulators
J Electr Electron Mater. 2020;33(4):303-309.   Published online July 1, 2020
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Include:
Development of Image Process for Crack Identification on Porcelain Insulators
J Electr Electron Mater. 2020;33(4):303-309.   Published online July 1, 2020
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